JPH0432757Y2 - - Google Patents

Info

Publication number
JPH0432757Y2
JPH0432757Y2 JP7007587U JP7007587U JPH0432757Y2 JP H0432757 Y2 JPH0432757 Y2 JP H0432757Y2 JP 7007587 U JP7007587 U JP 7007587U JP 7007587 U JP7007587 U JP 7007587U JP H0432757 Y2 JPH0432757 Y2 JP H0432757Y2
Authority
JP
Japan
Prior art keywords
power supply
pads
probe card
pad
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7007587U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63178326U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7007587U priority Critical patent/JPH0432757Y2/ja
Publication of JPS63178326U publication Critical patent/JPS63178326U/ja
Application granted granted Critical
Publication of JPH0432757Y2 publication Critical patent/JPH0432757Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP7007587U 1987-05-11 1987-05-11 Expired JPH0432757Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7007587U JPH0432757Y2 (en]) 1987-05-11 1987-05-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7007587U JPH0432757Y2 (en]) 1987-05-11 1987-05-11

Publications (2)

Publication Number Publication Date
JPS63178326U JPS63178326U (en]) 1988-11-18
JPH0432757Y2 true JPH0432757Y2 (en]) 1992-08-06

Family

ID=30911376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7007587U Expired JPH0432757Y2 (en]) 1987-05-11 1987-05-11

Country Status (1)

Country Link
JP (1) JPH0432757Y2 (en])

Also Published As

Publication number Publication date
JPS63178326U (en]) 1988-11-18

Similar Documents

Publication Publication Date Title
KR100712561B1 (ko) 웨이퍼 형태의 프로브 카드 및 그 제조방법과 웨이퍼형태의 프로브 카드를 구비한 반도체 검사장치
JP4252491B2 (ja) 検査機能付きモジュール及びその検査方法。
US4812742A (en) Integrated circuit package having a removable test region for testing for shorts and opens
US4899106A (en) Personality board
GB2353401A (en) An integrated circuit package incorporating a capacitive sensor probe
JP4667679B2 (ja) プローブカード用基板
JPH0432757Y2 (en])
JPS612338A (ja) 検査装置
JP2657315B2 (ja) プローブカード
JP2004138552A (ja) Icソケット
JP4131137B2 (ja) インターポーザ基板の導通検査方法
JP3135135B2 (ja) 半導体装置,その製造方法,その試験方法及びその試験装置
JP2000074975A (ja) 基板検査装置および基板検査方法
US4950981A (en) Apparatus for testing a circuit board
JP2926759B2 (ja) 半導体集積回路測定治具
JP2008203169A (ja) 半導体測定装置
JPH07111282A (ja) 半導体チップおよびそれを用いた半導体集積回路装置
JP3436183B2 (ja) 半導体検査装置およびそれを用いた検査方法
JPH0772212A (ja) Lsi測定ボード
JPH0315765A (ja) テストボード
JPH08242052A (ja) プリント配線板
JPS6170734A (ja) プロ−ブカ−ド
JPS63207146A (ja) プロ−ブカ−ド
JPS62294979A (ja) 接点配列のピツチ変更用アダプタ
JPH0754814B2 (ja) Icチツプの試験測定方法